ion microscope

英 [ˈaɪən ˈmaɪkrəskəʊp] 美 [ˈaɪən ˈmaɪkrəskoʊp]

n.  场致离子显微镜

电力



双语例句

  1. The researchers used what's called an ion microscope to compare the amount of normal hydrogen in the moon rocks to the amount of the hydrogen isotope deuterium, which carries an extra neutron.
    这项研究发表在《自然地球科学》期刊上。研究人员利用所谓的离子显微镜来比较月球岩石中正常的氢元素含量及同位素氘的含量,元素氘比卿多带一个中子。
  2. Method: The normal blood samples of72cases were examined by using of staining solution with different ion concentration under a microscope.
    方法:采用不同离子浓度的染色液对72例血红蛋白正常血标本进行检查分析。
  3. Nodular defects, which are in critical state of damage, are cross-sectioned by focusing on the ion beam and by imaging using a field emission scanning electron microscope.
    采用聚焦离子束和场发射扫描电镜对处于临界破坏状态的节瘤缺陷做剖面分析和观察。
  4. The research of scanning ion microscope
    扫描离子显微镜的研究
  5. Changes in surface roughness after gas cluster ion bombardments have been measured by an atomic force microscope.
    用原子力显微镜测量了气体离化团束照射后表面粗糙度的变化。
  6. The roughness and dynamic scaling behavior of the 6061 Al alloy surface implanted by nitrogen ion using plasma based ion implantation technology were studied by means of atomic force microscope and grazing incidence X-ray scattering.
    利用原子力显微镜和掠入射X射线散射技术研究了6061Al合金等离子体离子注氮表面的粗糙度和标度行为。
  7. Fatigue wear performance of TiN hard coating on the surface of high speed steel ( HSS) by ion sputtering deposition process was investigated using atomic force microscope.
    采用物理气相沉积工艺在高速钢表面沉积TiN薄膜,研究了TiN薄膜的疲劳磨损过程。
  8. Field Ion Microscope mode, in which information of surface atom structure is obtained;
    场离子显微镜模式,可以研究表面原子结构,提供具有原子分辨的实空间原子排列信息;
  9. The field ion microscope and the observation of surface structure of tungsten crystal
    场离子显微镜及钨晶体表面结构观察
  10. Field ion& scanning tunneling microscope
    场离子-扫描隧道显微镜
  11. The application of field ion microscope atom probe for Materials Science
    场离子显微镜原子探针在材料科学中的应用
  12. Technique on Preparing Test Samples for the Use of Field Ion Microscope Atomprobe Containing Crystal Boundary
    含晶界场离子显微镜&原子探针试样的制备技术
  13. Field Ion Microscope and Time-of-Flight Atom Probe and Their Applications to Quantitative Atom Microexamination on Solid Surface ( I)
    场离子显微镜和飞行时间原子探针及其在定量研究固体表面原子微观过程中的应用(一)
  14. Study on Both Shape and Chemical Composition at the Surface of Fly Ash by Scanning Electron Microscope, Focused Ion Beam, and Field Emission-Scanning Electron Microscope
    粉煤灰表面形貌和组成的电子显微镜/能量色散谱、聚焦离子束分析
  15. This paper deals with the normal procedure for foil sample making by ion milling, which is used for transmission electron microscope, as well as several points for selection of milling parameters.
    本文阐述了利用离子薄化技术制取透射电子显微镜用薄膜试样的一般程序和选择薄化参数时应注意的几个问题。
  16. The microstructure of melt spun Cu 88 Co 12 alloy was studied utilizing transmisson electron microscope ( TEM) and field ion microscope with atom probe ( FIM AP).
    本文利用场离子显微镜-原子探针(FIM-AP)及电镜研究了具有巨磁电阻效应(GMR)的甩带Cu88Co12合金的微结构。
  17. The action of 20 keV N+ ion on Deinococcus radiodurans and E. coli was investigated by means of scanning electron microscope ( SEM) and electron spin resonance ( ESR).
    以耐辐射异常微球菌(Deinococcusradiodurans)和大肠杆菌(E.coli)为试材,用显微扫描电镜(SEM)和电子自旋共振(ESR)波谱仪研究了20keV的N+离子注入对其细胞的作用。
  18. Important information including ion implantation, unipolar arcing, sputtering, Frenkel defect, etc. was obtained by electron microscope, AES and X-ray diffraction.
    借助于电子显微镜,俄歇电子能谱仪,X光衍射技术观测方法,获得了上述材料被焦点辐照瞬间的离子注入,单极电弧,溅射现象,Frenkel缺陷等重要物理过程的信息。
  19. The important effect of substrate nitration treating by ion beam on crystal structure, morphology and optical properties of ZnO films is investigated with X-ray diffraction, atomic force microscope, absorption and photoluminescence spectrum.
    通过对薄膜样品X射线衍射谱的分析、原子力显微图的观察、吸收光谱和荧光光谱的研究,发现Si衬底的离子束表面氮化对ZnO薄膜的晶体结构、表面形貌和光学性质有重要影响。
  20. The composition and depth distribution of elements on the surfaces of Co ion implantation modified carbon fiber microelectrode were determined by scanning electron microscope and Auger electron spectroscopy.
    用扫描电子显微镜(SEM)和俄歇电子能谱(AES)两种表面分析技术对Co离子注入修饰微电极的表面状况、表面元素组成及深度分布进行测定。
  21. Meanwhile, the authors also discuss on the related experimental methods, especially, electron probe microanalysis, ion probe, transmission electron microscope and laser Laman spectrometer.
    结合太阳系形成和演化的研究,特别对电子探针、离子探针、透射电子显微镜以及拉曼光谱等微束分析技术在该领域的应用和相关问题进行了讨论。
  22. The research of SIM/ ToF-SIMS instrument is an advanced subject in the field of surface analysis. The Scanning Ion Microscope ( SIM) is its first part.
    扫描离子显微镜-飞行时间质谱仪(即SIM/ToF-SIMS)的研究是表面分析领域的前沿课题。
  23. Methods Animal models were induced by a free falling device and the changes in calcium ion concentrations of brain cells were measured by laser scanning confocal microscope.
    方法通过硬膜外自由落体打击法,制备颅脑损伤动物模型;采用激光扫描共聚焦显微镜技术,测定颅脑损伤后脑细胞内钙离子浓度变化及脑组织含水量的变化。
  24. The effect of hydrogen ion implantation on the microstructure of ODS ferritic steel was studied by means of ion implantation at room temperature and in-situ observations in a low voltage electron microscope.
    采用室温离子注入和低压电镜原位观察的方法,研究了注氢对国产ODS铁素体钢微观结构的影响。
  25. Optical, backscattered electron, secondary ion, and high-precision transmission electron microscope image analyses of samples containing moderate to high gold concentrations in sediment-hosted micro-disseminated gold deposits indicate that gold is strongly correlated with As on a microscopic scale.
    对秦岭沉积岩为岩矿岩石的微细浸染型金矿床中-高含量金样品的光学、背散射电子、二次离子和高分辨透射电镜图象分析表明,金与砷具有显微尺度的强相关性。
  26. Hour and 6 hours after brain injury, the water content and the ion content in the brain tissue were determined, and the edema formation and ultrastructural destruction in the brain tissue were assessed by light microscope ( LM) and the electron microscope ( EM) respectively.
    伤后1小时及6小时,检测脑组织含水量、离子含量,并取标本行病理及电镜检查;(2)用伊文氏蓝(EB)定量、胶体金(CG)示踪血脑屏障通透性的变化。
  27. The cavitation erosion behavior of TiN, CrN and ( Ti, Cr) N hard coatings produced by arc ion plating on the surface of grey cast iron was studied with an ultrasonic cavitation erosion testing apparatus and a scanning electron microscope.
    利用磁致伸缩振动空蚀试验装置,研究了灰口铸铁表面多弧离子镀TiN、CrN及(Ti,Cr)N硬质膜的抗空蚀性能。
  28. In search for a high-intensity coherent electron source, a facility has been developed that can function as a LEEPS microscope or a field-emission/ field ion microscope ( FEM/ FIM).
    为寻找高强度的相干电子源,我们自主研制了一台集低能电子点源显微镜和场发射/场离子显微镜于一体的设备。